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iSQI CTFL-AuT Exam Topics

iSQI CTFL-AuT Exam Overview :

Exam Name: ISTQB Certified Tester Foundation Level, Automotive Software Tester
Exam Code: CTFL-AuT
Certifications: iSQI ISTQB Certified Tester Certification
Actual Exam Duration: 60 minutes
Expected no. of Questions in Actual Exam: 40
See Expected Questions: iSQI CTFL-AuT Expected Questions in Actual Exam

iSQI CTFL-AuT Exam Objectives :

Section Objectives
1 Introduction (K2) [30 Min]     1.1 Requirements from divergent project objectives and increasing product complexity (K2) [15 Min]
    1.2 Project aspects influenced by standards (K1) [5 Min]
    1.3 The six generic phases in the system lifecycle (K1) [5 Min]
    1.4 The contribution/participation of the tester in the release process (K1) [5 Min]
2 Standards for the testing of E/E systems (K3) [300 Min] 2.1 Automotive SPICE (ASPICE) (K3) [140 Min]
    2.1.1 Design and structure of the standard (K2) [25 Min]
        2.1.1.1 The two dimensions of ASPICE
        2.1.1.2 Process categories in the process dimension
        2.1.1.3 Capability levels in the capability dimension
    2.1.2 Requirements of the standard (K3) [115 Min]
        2.1.2.1 Test specific processes
        2.1.2.2 Assessment levels and capability indicators
        2.1.2.3 Test strategy and regression test strategy
        2.1.2.4 Test documentation in ASPICE
        2.1.2.5 Verification strategy and criteria for unit verification (SWE.4)
        2.1.2.6 Traceability in Automotive SPICE (ASPICE)
        
2.2 ISO 26262 (K3) [125 Min]
    2.2.1 Functional safety and safety culture (K2) [20 Min
        2.2.1.1 Objective of functional safety for E/E systems
        2.2.1.2 Contribution of the tester to the safety culture
    2.2.2 Integration of the tester in the safety lifecyle (K2) [15 min]
    2.2.3 Structure and test specific parts of the standard (K1) [10 Min]
        2.2.3.1 Design and structure of the standard [informative]
        2.2.3.2 Relevant volumes (parts) for the tester
    2.2.4 The influence of criticality on the extent of the test (K2) [20 Min]
        2.2.4.1 The criticality levels of ASIL
        2.2.4.2 Influence of ASIL on test techniques, test types and the extent of the test
    2.2.5 Application of content from CTFL® in the context of ISO 26262 (K3) [60 Min]
        
2.3 AUTOSAR (K1) [15 Min]
    2.3.1 Objectives of AUTOSAR (K1) [5 Min]
    2.3.2 General structure of AUTOSAR (K1) [informative] [5 Min]
    2.3.3 Influence of AUTOSAR on the work of the tester (K1) [5 Min]

2.4 Comparison (K2) [20 Min]
    2.4.1 Objectives of ASPICE and ISO 26262 (K1) [5 Min]
    2.4.2 Comparison of the test levels (K2) [15 Min]
3 Testing in a virtual environment (K3) [160 Min] 3.1 Test environment in general (K2) [30 Min]
    3.1.1 Motivation for a test environment in the automotive development (K1) [5 Min]
    3.1.2 General parts of a test environment (K1) [5 Min]
    3.1.3 Differences between Closed-Loop and Open-Loop (K2) [15 Min]
        3.1.3.1 Open-Loop-System
        3.1.3.2 Closed-Loop-System
    3.1.4 Essential interfaces, databases and communication protocols of a electronic control unit (K1) [5 Min]

3.2 Testing in XiL test environments (K3) [130 Min]
    3.2.1 Model in the Loop (MiL) (K2) [20 Min]
        3.2.1.1 Structure of a MiL test environment
        3.2.1.2 Application areas and boundary conditions of a MiL test environment
    3.2.2 Software in the Loop (SiL) (K1) [10 Min]
        3.2.2.1 Structure of a SiL test environment
        3.2.2.2 Application areas and boundary conditions of a SiL test environment
    3.2.3 Hardware in the Loop (HiL) (K2) [20 Min]
        3.2.3.1 Structure of a HiL test environmen
        3.2.3.2 Application areas and boundary conditions of a HiL test environment
    3.2.4 Comparison of the XiL test environments (K3) [80 Min]
        3.2.4.1 Advantages and disadvantages oftesting in the XiL test environments
        3.2.4.2 Allocation of test cases to one or more test environments
        3.2.4.3 Classification of the XiL test environments (MiL, SiL, HiL) in the general V-model
4 Automotive-specific static and dynamic test techniques [230 Min] 4.1 Static test techniques (K3) [75 Min]
    4.1.1 The MISRA-C: 2012 Guidelines (K2) [15 Min]
    4.1.2 Quality characteristics for reviews of requirements (K3) [60 Min]

4.2 Dynamic test techniques (K3) [155 Min]
    4.2.1 Condition testing, multiple condition testing, modified condition/decision testing (K3) [60 Min]
    4.2.2 Back-to-Back-Testing (K2) [15 Min]
    4.2.3 Fault injection testing (K2) [15 Min]
    4.2.4 Requirements-based testing (K1) [5 Min]
    4.2.5 Context-dependent selection of test techniques (K3) [60 Min]
Official Information https://www.istqb.org/certifications/automotive-software-tester

Updates in the iSQI CTFL-AuT Exam Topics:

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